Improving Dielectric Nanoresonator Array Coatings for Solar Cells

Dongheon Ha; Nikolai B. Zhitenev

doi:10.1002/ppsc.201800131

Improving Dielectric Nanoresonator Array Coatings for Solar Cells

Dongheon Ha
, Nikolai B. Zhitenev

Physics

Center for Nanoscale Science and Technology
National Institute of Standards and Technology
Maryland Nanocenter
University of Maryland, College Park

Producción científica › revisión exhaustiva

Idioma original	English
Número de artículo	1800131
Publicación	Particle and Particle Systems Characterization
Volumen	35
N.º	7
DOI	https://doi.org/10.1002/ppsc.201800131
Estado	Published - jul 2018

ASJC Scopus Subject Areas

General Chemistry
General Materials Science
Condensed Matter Physics

Acceder al documento

10.1002/ppsc.201800131

Otros archivos y enlaces

Citar esto

@article{04c6bfb436ee400aa4a9dc4450c922a1,

title = "Improving Dielectric Nanoresonator Array Coatings for Solar Cells",

keywords = "antireflection coatings (ARCs), nanospheres, near-field scanning optical microscopy (NSOM), photocurrent enhancements, whispering gallery modes",

author = "Dongheon Ha and Zhitenev, \{Nikolai B.\}",

note = "Publisher Copyright: {\textcopyright} 2018 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim",

year = "2018",

month = jul,

doi = "10.1002/ppsc.201800131",

language = "English",

volume = "35",

journal = "Particle and Particle Systems Characterization",

issn = "0934-0866",

number = "7",

}

TY - JOUR

T1 - Improving Dielectric Nanoresonator Array Coatings for Solar Cells

AU - Ha, Dongheon

AU - Zhitenev, Nikolai B.

PY - 2018/7

Y1 - 2018/7

KW - antireflection coatings (ARCs)

KW - nanospheres

KW - near-field scanning optical microscopy (NSOM)

KW - photocurrent enhancements

KW - whispering gallery modes

UR - https://www.scopus.com/pages/publications/85050074503

UR - https://www.scopus.com/pages/publications/85050074503#tab=citedBy

U2 - 10.1002/ppsc.201800131

DO - 10.1002/ppsc.201800131

M3 - Article

AN - SCOPUS:85050074503

SN - 0934-0866

VL - 35

JO - Particle and Particle Systems Characterization

JF - Particle and Particle Systems Characterization

IS - 7

M1 - 1800131

ER -